cathodoluminescence; conductive‐AFM; electron backscatter diffraction; grain boundary; solar cell; AFM; Complex materials; Conductive AFM; Electron back scatter diffraction; Grain-boundaries; Material behaviour; Property; Solar cell absorbers; Tunneling current; Pathology and Forensic Medicine; Histology
Abstract :
[en] Multi-microscopy offers significant benefits to the understanding of complex materials behaviour by providing complementary information from different properties. However, some characterisations may strongly influence other measurements in the same workflow. To acquire reliable and valid datasets, optimising multi-microscopy procedure is necessary. In present work, we studied the influence of the measurement order on the quality of multi-microscopy datasets. Multi-microscopy incorporating tunnelling current AFM (TUNA), electron backscatter diffraction (EBSD), and cathodoluminescence (CL) on a polycrystalline solar cell absorber, Cu(In,Ga)S2 (CIGS), is used as an example. The investigation revealed potential characterisation-induced contaminations, such as surface oxidation and hydrocarbon layer coating, of the sample surface. Their subsequent influence on the measurement results of following correlation techniques was examined. To optimise the dataset quality, multi-microscopy should be carried out in TUNA-EBSD-CL order, from the most to the least surface sensitive techniques. With the optimised multi-microscopy measurement order on a CIGS absorber, we directly correlated the local changes in electrical and opto-electronic properties with the microstructure of grain boundaries (GBs). The described methodology may also provide insightful concepts for applying other AFM-SEM-based multi-microscopy on different semiconductor materials.
Disciplines :
Physics
Author, co-author :
Hu, Yucheng ; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
Kusch, Gunnar; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
ADELEYE, Damilola ; University of Luxembourg > Faculty of Science, Technology and Medicine > Department of Physics and Materials Science > Team Susanne SIEBENTRITT
SIEBENTRITT, Susanne ; University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS)
Oliver, Rachel; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
External co-authors :
yes
Language :
English
Title :
TUNA-EBSD-CL correlative multi-microscopy study, on the example of Cu(In,Ga)S2 solar cell absorber.
Engineering and Physical Sciences Research Council Henry Royce Institute Fonds National de la Recherche Luxembourg
Funding text :
Cambridge authors would like to acknowledge funding from the EPSRC under EP/V029231/1 and EP/R025193/1. Part of this work was supported by the Henry Royce Institute for the Royce\u2010AFM at Cambridge; Cambridge Royce facilities grant EP/P024947/1 and Sir Henry Royce Institute \u2013 recurrent grant EP/R00661X/1. Authors also wish to thank Prof Marc De Graef and Dr Elena Pasca from Carnegie Mellon University for their kind support on the usage of EBSD indexing software, EMsoft. Luxembourg team would like to thank Fonds National de la Recherche Luxembourg (FNR) for funding in the framework of the MASSENA project (Project No. PRIDE 15/10935404), and the as well as the REACH (Project No. INTER/UKRI/20/15050982).
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