Reference : Oxidation as Key Mechanism for Efficient Interface Passivation in Cu(In,Ga)Se2 Thin-Fil...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/43582
Oxidation as Key Mechanism for Efficient Interface Passivation in Cu(In,Ga)Se2 Thin-Film Solar Cells
English
Werner, Florian mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Veith-Wolf, Boris [Institute for Solar Energy Research Hamelin (ISFH) - Germany]
Spindler, Conrad mailto [University of Luxembourg > Luxembourg Centre for Systems Biomedicine (LCSB) > Physics and Materials Science Research Unit >]
Barget, Michael mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Babbe, Finn mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Guillot, Jerome [Luxembourg Institute of Science & Technology - LIST]
Schmidt, Jan [Institute for Solar Energy Research Hamelin (ISFH) - Germany]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
2020
Physical Review Applied
American Physical Society
Yes (verified by ORBilu)
International
2331-7019
2331-7043
College Park
MD
http://hdl.handle.net/10993/43582
10.1103/PhysRevApplied.13.054004

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