Absorption Coefficient of a Semiconductor Thin Film from Photoluminescence

Rey, Germain; Spindler, Conrad; Rachad, Wafae; Siebentritt, Susanne; Babbe, Finn; Nuys, M.; Carius, R.; Li, S.; Platzer-Björkman, C.

doi:10.1103/PhysRevApplied.9.064008

Reference : Absorption Coefficient of a Semiconductor Thin Film from Photoluminescence


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	Focus Areas :	Physics and Materials Science
	To cite this reference:	http://hdl.handle.net/10993/36233

Title :	Absorption Coefficient of a Semiconductor Thin Film from Photoluminescence
Language :	English
Author, co-author :	Rey, Germain [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Spindler, Conrad [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Rachad, Wafae [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Babbe, Finn [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Nuys, M. [Forschungszentrum Jülich GmbH Institut für Energie und Klimaforschung, Germany]
	Carius, R. [Forschungszentrum Jülich GmbH Institut für Energie und Klimaforschung, Germany]
	Li, S. [Ångström Solar Center, Solid State Electronics, Uppsala University, Sweden]
	Platzer-Björkman, C. [Ångström Solar Center, Solid State Electronics, Uppsala University, Sweden]
Publication date :	2018
Journal title :	Physical Review Applied
Publisher :	American Physical Society
Volume :	9
Pages :	064008
Peer reviewed :	Yes (verified by ORBi^lu)
Audience :	International
ISSN :	2331-7019
e-ISSN :	2331-7043
City :	College Park
Country :	MD
Permalink :	http://hdl.handle.net/10993/36233
DOI :	10.1103/PhysRevApplied.9.064008

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