Article (Scientific journals)
Optical properties of Cu2ZnSnSe4 thin films and identification of secondary phases by spectroscopic ellipsometry
Demircioglu, Ozden; Salas, Jose Fabio Lopez; Rey, Germain et al.
2017In Optics Express, 25 (5), p. 5327-5340
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Abstract :
[en] We apply spectroscopic ellipsometry (SE) to identify secondary phases in Cu2ZnSnSe4 (CZTSe) absorbers and to investigate the optical properties of CZTSe. A detailed optical model is used to extract the optical parameters, such as refractive index and extinction coefficient in order to extrapolate the band gap values of CZTSe samples, and to obtain information about the presence of secondary phases at the front and back sides of the samples. We show that SE can be used as a non-destructive method for detection of the secondary phases ZnSe and MoSe2 and to extrapolate the band gap values of CZTSe phase. (C) 2017 Optical Society of America
Disciplines :
Physics
Author, co-author :
Demircioglu, Ozden
Salas, Jose Fabio Lopez
Rey, Germain 
Weiss, Thomas
Mousel, Marina
Redinger, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Susanne, Siebentritt
Parisi, Juergen
Guetay, Levent
External co-authors :
yes
Language :
English
Title :
Optical properties of Cu2ZnSnSe4 thin films and identification of secondary phases by spectroscopic ellipsometry
Publication date :
2017
Journal title :
Optics Express
ISSN :
1094-4087
Publisher :
Optical Society of America, Washington, United States - District of Columbia
Volume :
25
Issue :
5
Pages :
5327-5340
Peer reviewed :
Peer Reviewed verified by ORBi
Focus Area :
Physics and Materials Science
Available on ORBilu :
since 18 November 2017

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