Paper published in a book (Scientific congresses, symposiums and conference proceedings)
Selection, Evaluation and Generation of Test Cases in an Industrial Setting: a Process and a Tool
Guelfi, Nicolas; Ries, Benoît
2008In Practice and Research Techniques, 2008. TAIC PART '08. Testing: Academic & Industrial Conference
Peer reviewed
 

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Keywords :
Embedded Software; Model-Driven Engineering; Process; Industrial Context; Tool Support; Model Transf
Abstract :
[en] The test phase in safety-critical systems industry is a crucial phase of the development process. Some companies of these industries have their own test methods which do not reuse the notions available in the theory of software testing or model driven engineering. This paper reports on an experience in a testing process improvement made inside a safetycritical systems company in order to improve the quality of the test phase improvement. We present the initial situation, the objectives, the proposed process and the tools that are used to support it. In particular, we show that the most efficient improvements were achieved concerning the test process definition and in allowing a tailored and precise delimitation of the systems elements to be tested.
Disciplines :
Computer science
Identifiers :
UNILU:UL-CONFERENCE-2009-358
Author, co-author :
Guelfi, Nicolas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Ries, Benoît ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
no
Language :
English
Title :
Selection, Evaluation and Generation of Test Cases in an Industrial Setting: a Process and a Tool
Publication date :
2008
Event name :
Testing: Academic & Industrial Conference
Event place :
Windsor, United Kingdom
Event date :
2008
Audience :
International
Main work title :
Practice and Research Techniques, 2008. TAIC PART '08. Testing: Academic & Industrial Conference
Publisher :
IEEE
ISBN/EAN :
978-0-7695-3383-4
Pages :
47-51
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 24 June 2013

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