Article (Scientific journals)
Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
Demircio glu, Ozden; Mousel, Marina; Redinger, Alex et al.
2015In JOURNAL OF APPLIED PHYSICS, 118, p. 185302-1
Peer reviewed
 

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Disciplines :
Physics
Author, co-author :
Demircio glu, Ozden;  University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory
Mousel, Marina ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Redinger, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Rey, Germain ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Weiss, Thomas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Siebentritt, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Riedel, Ingo;  University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory
Gütay, Levent ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
External co-authors :
yes
Language :
English
Title :
Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
Publication date :
2015
Journal title :
JOURNAL OF APPLIED PHYSICS
Volume :
118
Pages :
185302-1
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 23 November 2015

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