Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry

Reference : Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/22513

Title :	Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
Language :	English
Author, co-author :	Demircio glu, Ozden [University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory]
	Mousel, Marina [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Rey, Germain [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Weiss, Thomas Paul [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Riedel, Ingo [University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory]
	Gütay, Levent [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	2015
Journal title :	JOURNAL OF APPLIED PHYSICS
Volume :	118
Pages :	185302-1
Peer reviewed :	Yes
Audience :	International
Permalink :	http://hdl.handle.net/10993/22513

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