Article (Scientific journals)
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
Guelfi, Nicolas; Ries, Benoît
2008In ERCIM News, 75
Peer reviewed
 

Files


Full Text
2008_ERCIM_NEWS_75_SESAME_Process.pdf
Author postprint (127.39 kB)
Request a copy

All documents in ORBilu are protected by a user license.

Send to



Details



Keywords :
safety-critical; embedded systems; methodology; software engineering; test selection
Disciplines :
Computer science
Author, co-author :
Guelfi, Nicolas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Ries, Benoît ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Language :
English
Title :
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
Publication date :
October 2008
Journal title :
ERCIM News
ISSN :
0926-4981
Publisher :
ERCIM, Sophia-Antipolis, France
Special issue title :
Safety-Critical Software
Volume :
75
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 07 May 2013

Statistics


Number of views
67 (8 by Unilu)
Number of downloads
2 (1 by Unilu)

Bibliography


Similar publications



Contact ORBilu