Article (Scientific journals)
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
GUELFI, Nicolas; RIES, Benoît
2008In ERCIM News, 75
Peer reviewed
 

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Keywords :
safety-critical; embedded systems; methodology; software engineering; test selection
Disciplines :
Computer science
Author, co-author :
GUELFI, Nicolas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
RIES, Benoît ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Language :
English
Title :
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
Publication date :
October 2008
Journal title :
ERCIM News
ISSN :
0926-4981
Publisher :
ERCIM, Sophia-Antipolis, France
Special issue title :
Safety-Critical Software
Volume :
75
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 07 May 2013

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