SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems

Reference : SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems


	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/1107

Title :	SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
Language :	English
Author, co-author :	Guelfi, Nicolas [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
	Ries, Benoît [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Publication date :	Oct-2008
Journal title :	ERCIM News
Publisher :	ERCIM
Volume :	75
Special issue title :	Safety-Critical Software
Peer reviewed :	Yes
Audience :	International
ISSN :	0926-4981
City :	Sophia-Antipolis
Country :	France
Keywords :	[en] safety-critical ; embedded systems ; methodology ; software engineering ; test selection
Permalink :	http://hdl.handle.net/10993/1107

File(s) associated to this reference

Fulltext file(s):

	File	Commentary	Version	Size	Access
Limited access	2008_ERCIM_NEWS_75_SESAME_Process.pdf		Author postprint	124.4 kB	Request a copy

All documents in ORBi^lu are protected by a user license.