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SCTL: A StateChart Transformation Language for Test Sets Reduction
Guelfi, Nicolas; Ries, Benoît
2005In ERCIM Workshop on Dependable Software Intensive Embedded Systems, workshop of the 31st EUROMICRO Conference on Software Engineering and Advanced Appli
Peer reviewed
 

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Keywords :
Statecharts; Transformation; Test; Specification; Embedded Systems
Abstract :
[en] Specification and testing activities are key phases in embedded systems development life cycles. In specification-based testing approaches, test cases are solely generated from the system specification. Test cases are often too numerous to be executed exhaustively. In practice, test engineers often select test cases based on informal approximations. We aim at improving these activities by formulating abstraction hypotheses on system specifications, to reduce generated test sets. Our general application framework is the automotive industry, and we aim the specific domain of small-sized real-time embedded systems that must be highly reliable. The main result presented in this paper is a model transformation language that helps test engineers to select test cases based on system specifications.
Disciplines :
Computer science
Identifiers :
UNILU:UL-CONFERENCE-2009-357
Author, co-author :
Guelfi, Nicolas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Ries, Benoît ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
no
Language :
English
Title :
SCTL: A StateChart Transformation Language for Test Sets Reduction
Publication date :
2005
Event name :
ERCIM Workshop on Dependable Software Intensive Embedded Systems, workshop of the 31st EUROMICRO Conference on Software Engineering and Advanced Appli
Event place :
Porto, Portugal
Event date :
2005
Audience :
International
Main work title :
ERCIM Workshop on Dependable Software Intensive Embedded Systems, workshop of the 31st EUROMICRO Conference on Software Engineering and Advanced Appli
Publisher :
ERCIM
Collection name :
Workshop Proceedings
Peer reviewed :
Peer reviewed
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