Profil

KELLER Patrick

Main Referenced Co-authors
NAVET, Nicolas  (2)
BISSYANDE, Tegawendé  (1)
Creighton, Oliver (1)
KABORE, Abdoul Kader  (1)
KLEIN, Jacques  (1)
Main Referenced Keywords
Code Classification (1); Code Clone (1); Code Embedding (1); Design Automation (1); design space exploration (1);
Main Referenced Unit & Research Centers
Interdisciplinary Centre for Security, Reliability and Trust (SnT) > Trustworthy Software Engineering (TruX) (1)
Main Referenced Disciplines
Computer science (2)
Electrical & electronics engineering (1)

Publications (total 3)

The most downloaded
1082 downloads
Creighton, O., Navet, N., Keller, P., & Migge, J. (16 September 2020). Towards Computer-Aided, Iterative TSN-and Ethernet-based E/E Architecture Design [Paper presentation]. 2020 IEEE Standards Association (IEEE-SA) Ethernet & IP @ Automotive Technology Day, Munich, Germany. https://hdl.handle.net/10993/44490

The most cited

10 citations (Scopus®)

Keller, P., Kabore, A. K., Plein, L., Klein, J., Le Traon, Y., & Bissyande, T. F. D. A. (2021). What You See is What it Means! Semantic Representation Learning of Code based on Visualization. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3485135 https://hdl.handle.net/10993/48899

Keller, P., & Navet, N. (2022). Approximating WCRT through the aggregation of short simulations with different initial conditions: application to TSN. In 30th International Conference on Real-Time Networks and Systems (RTNS ’22).
Peer reviewed

Keller, P., Kabore, A. K., Plein, L., Klein, J., Le Traon, Y., & Bissyande, T. F. D. A. (2021). What You See is What it Means! Semantic Representation Learning of Code based on Visualization. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3485135
Peer Reviewed verified by ORBi

Creighton, O., Navet, N., Keller, P., & Migge, J. (16 September 2020). Towards Computer-Aided, Iterative TSN-and Ethernet-based E/E Architecture Design [Paper presentation]. 2020 IEEE Standards Association (IEEE-SA) Ethernet & IP @ Automotive Technology Day, Munich, Germany.

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