2013 • In 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013
Klein, Jacques ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Le Traon, Yves ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
yes
Language :
English
Title :
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing
Publication date :
2013
Event name :
A-MOST Workshop, ICST
Event place :
LU, Luxembourg
Event date :
March 2013
Audience :
International
Main work title :
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013
