Article (Scientific journals)
In-depth resolved Raman scattering analysis for the identification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications
Fontané, Xavier; Calvo-Barrio, L.; Izquierdo-Roca, V. et al.
2011In Applied Physics Letters, 98 (181905), p. 1819051-1819053
Peer reviewed
 

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In-depth resolved Raman scattering annalysis for the idenrrification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications_2011.pdf
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Disciplines :
Physics
Identifiers :
UNILU:UL-ARTICLE-2011-764
Author, co-author :
Fontané, Xavier
Calvo-Barrio, L.
Izquierdo-Roca, V.
Saucedo, E.
Pérez-Rodriguez, A.
Morante, J. R.
Berg, D. M.
SIEBENTRITT, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Language :
English
Title :
In-depth resolved Raman scattering analysis for the identification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications
Publication date :
2011
Journal title :
Applied Physics Letters
ISSN :
0003-6951
Publisher :
American Institute of Physics
Volume :
98
Issue :
181905
Pages :
1819051-1819053
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 15 October 2013

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