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In-depth resolved Raman scattering analysis for the identification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications
Fontané, Xavier; Calvo-Barrio, L.; Izquierdo-Roca, V. et al.
2011In Applied Physics Letters, 98 (181905), p. 1819051-1819053

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In-depth resolved Raman scattering annalysis for the idenrrification of secondary phases-characterization of Cu2ZnSnS4 layers for solar cell applications_2011.pdf

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