Article (Scientific journals)
Spatially resolved measurements of depletion properties of large gate two-dimensional electron gas semiconductor terahertz modulators
Kleine-Ostmann, T.; Pierz, K.; Hein, G. et al.
2009In Journal of Applied Physics, 105 (9), p. 093707-1-093707-6
Peer reviewed
 

Files


Full Text
163_JAP_105_2009_093707.pdf
Publisher postprint (586.67 kB)
Request a copy

All documents in ORBilu are protected by a user license.

Send to



Details



Disciplines :
Electrical & electronics engineering
Identifiers :
UNILU:UL-ARTICLE-2009-392
Author, co-author :
Kleine-Ostmann, T.;  Technische Universität Braunschweig, Schleinitzstraße 22, D-38106 Braunschweig, Germany > Institut für Hochfrequenztechnik
Pierz, K.;  Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
Hein, G.;  Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
Dawson, P.;  University of Manchester, Manchester M60 1QD, United Kingdom > Photon Science Institute, Alan Turing Building, School of Physics and Astronomy
Marso, Michel ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit
Koch, Martin;  Technische Universität Braunschweig, Schleinitzstraße 22, D-38106 Braunschweig, Germany > Institut für Hochfrequenztechnik
Language :
English
Title :
Spatially resolved measurements of depletion properties of large gate two-dimensional electron gas semiconductor terahertz modulators
Publication date :
2009
Journal title :
Journal of Applied Physics
ISSN :
0021-8979
Publisher :
American Institute of Physics, Melville, United States - New York
Volume :
105
Issue :
9
Pages :
093707-1-093707-6
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 25 September 2013

Statistics


Number of views
57 (0 by Unilu)
Number of downloads
0 (0 by Unilu)

Scopus citations®
 
33
Scopus citations®
without self-citations
31
OpenCitations
 
32
WoS citations
 
30

Bibliography


Similar publications



Contact ORBilu