Article (Scientific journals)
Finite element simulation of metal-semiconductor-metal photodetector
Guarino, G.; Donaldson, W. R.; Mikulics, Martin et al.
2009In Solid-State Electronics, 53 (10), p. 1144-1148
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Disciplines :
Electrical & electronics engineering
Identifiers :
UNILU:UL-ARTICLE-2009-715
Author, co-author :
Guarino, G.;  University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics
Donaldson, W. R.;  University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics
Mikulics, Martin;  Research Centre Jülich, D-52425 Jülich, Germany > Institute of Bio- and Nanosystems and Jülich-Aachen Research Alliance, JARA, Fundamentals of Future Information Technology
Marso, Michel ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit
Kordos, Peter;  Slovak Academy of Sciences, SK-84104 Bratislava, Slovak Republic > Institute of Electrical Engineering
Sobolewski, Roman;  University of Rochester, Rochester, NY 14627-0231, USA > Department of Electrical and Computer Engineering and the Laboratory for Laser Energetics
Language :
English
Title :
Finite element simulation of metal-semiconductor-metal photodetector
Publication date :
2009
Journal title :
Solid-State Electronics
ISSN :
0038-1101
Publisher :
Pergamon Press - An Imprint of Elsevier Science
Volume :
53
Issue :
10
Pages :
1144-1148
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 25 September 2013

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