Article (Scientific journals)
MUPPAAL: Efficient Elimination and Reduction of Useless Mutants in Real-Time Model-Based Systems
Cuartas, Jaime; Cortés, David; Betancourt, Joan et al.
2025In Software Testing, Verification and Reliability, 35 (1)
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Keywords :
model-based testing; mutation testing; timed automata; UPPAAL; % reductions; Bisimulations; Model based testing; Model-based systems; Mutation testing; Real time modeling; Safety critical systems; Test quality; Timed Automata; Software; Safety, Risk, Reliability and Quality
Abstract :
[en] To assess test quality, mutation testing (MT) creates mutants by injecting artificial faults into the system and evaluates the ability of tests to distinguish these mutants. Tests distinguishing more mutants have also been proven empirically to detect more real faults. MT has been applied to many domains. We focus on MT for timed safety-critical systems modelled as Timed Automata (TA). While powerful, MT usually yields equivalent and duplicate mutants, the former having the same behaviour as the original system and the latter other mutants. Such useless mutants bring no value, waste execution time and can be difficult to detect. We integrate useless mutant detection and removal strategies in our mutation framework MUPPAAL. MUPPAAL leverages existing equivalence-avoiding mutation operators and focuses on detecting mutant duplicates using a scalable bisimulation algorithm and a fast approximate one based on biased simulation. We also demonstrate how to design an operator that reduces the occurrence of mutant duplicates. We evaluate MUPPAAL on six systems, demonstrating that (1) mutant duplicates account for up to 32% of all generated mutants, (2) our bisimulation approach scales effectively with these systems and (3) biased simulations further enhance performance. Our heuristic is 10 times faster than bisimulation and limits the exploration to two times the number of exact duplicates compared to up to 10 times for the baseline.
Disciplines :
Computer science
Author, co-author :
Cuartas, Jaime;  Faculty of Information Technology, Monash University, Melbourne, Australia
Cortés, David ;  EISC, Universidad del Valle, Cali, Colombia
Betancourt, Joan;  EISC, Universidad del Valle, Cali, Colombia
Aranda, Jesús;  EISC, Universidad del Valle, Cali, Colombia
CORDY, Maxime  ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > SerVal
Ortiz, James ;  LTCI, Télécom Paris, Institut Polytechnique de Paris, Palaiseau, France
Perrouin, Gilles ;  Faculty of Computer Science, University of Namur, Namur, Belgium
Schobbens, Pierre-Yves ;  Faculty of Computer Science, University of Namur, Namur, Belgium
External co-authors :
yes
Language :
English
Title :
MUPPAAL: Efficient Elimination and Reduction of Useless Mutants in Real-Time Model-Based Systems
Publication date :
January 2025
Journal title :
Software Testing, Verification and Reliability
ISSN :
0960-0833
eISSN :
1099-1689
Publisher :
John Wiley and Sons Ltd
Volume :
35
Issue :
1
Peer reviewed :
Peer Reviewed verified by ORBi
Funding text :
Gilles Perrouin is an Fnrs (Fonds National de la Recherche Scientifique) Research Associate. Jaime Cuartas received support from ERASMUS+ while at the University of Namur. Maxime Cordy obtained funding from FNR Luxembourg (grant INTER/FNRS/20/15077233/Scaling Up Variability/Cordy). Work partially funded by ERDF project IDEES. Thanks to the multilateral agreement between the University of Namur and Universidad del Valle.
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