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Difficulty-Adjusted Quizzes: An Effectiveness Analysis
ATASHPENDAR, Aryobarzan; ROTHKUGEL, Steffen
2023In Proceedings of the 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
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Keywords :
Testing effect; Digital quiz; Case study
Abstract :
[en] To improve long-term retention, regular testing allows students to apply their knowledge to practical tasks and consequently reinforce their memory. To integrate regular testing in a university-level course, the mobile application BEACON Q was developed to provide students with a quiz for each weekly lecture. It dynamically tailors the difficulty of questions to their capabilities and presents detailed explanations to serve as immediate feedback to their answers. This work analyzes the app’s usage during a semester by examining the performance data of the users, their survey answers, as well as potential correlations between the app’s design and the students’ interactions. The results are discussed in terms of the hurdles to overcome when integrating regular testing in the learner’s curriculum while supporting the design principles which constitute the testing effect. Additionally, recommendations are provided for other educators who want to introduce a similar quiz app in their curriculum, which also serves as future work for BEACON Q.
Disciplines :
Computer science
Author, co-author :
ATASHPENDAR, Aryobarzan  ;  University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Computer Science (DCS)
ROTHKUGEL, Steffen ;  University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Computer Science (DCS)
External co-authors :
no
Language :
English
Title :
Difficulty-Adjusted Quizzes: An Effectiveness Analysis
Publication date :
28 November 2023
Event name :
IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE 2023)
Event date :
28 November 2023 - 1 December 2023
Audience :
International
Main work title :
Proceedings of the 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
Publisher :
IEEE Xplore Digital Library
ISBN/EAN :
978-1-6654-5331-8
Peer reviewed :
Peer reviewed
Focus Area :
Educational Sciences
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since 31 January 2024

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