Mikulics, Martin; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Hardtdegen, Hilde; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Winden, Andreas; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Fox, Alfred; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Marso, Michel ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit
Sofer, Zdenek; Department of Inorganic Chemistry, Institute of Chemical Technology, Technická 5, Prague 6, Czech Republic
Lüth, Hans; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Grützmacher, Detlev; Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, 52425 Jülich, Germany and Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Germany
Kordos, Peter; Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia and Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia
Language :
English
Title :
Residual strain in recessed AlGaN/GaN heterostructure field-effect transistors evaluated by micro photoluminescence measurements
Publication date :
2012
Journal title :
Physica Status Solidi C. Current Topics in Solid State Physics