Tomographic characterization of grain-size correlations in polycrystalline Al-Sn

Krill III, C. E.; Döbrich, K. M.; Michels, D.; Michels, Andreas; Rau, C.; Weitkamp, T.; Snigirev, A.; Birringer, R.; Bonse, U.

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Tomographic characterization of grain-size correlations in polycrystalline Al-Sn

Krill III, C. E.; Döbrich, K. M.; Michels, D. et al.

2002 • In Developments in X-Ray Tomography III

Peer reviewed

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Disciplines :

Physics

Identifiers :

UNILU:UL-CHAPTER-2010-190

Author, co-author :

Krill III, C. E.

Döbrich, K. M.

Michels, D.

Michels, Andreas ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit

Rau, C.

Weitkamp, T.

Snigirev, A.

Birringer, R.

Bonse, U.

Language :

English

Title :

Tomographic characterization of grain-size correlations in polycrystalline Al-Sn

Publication date :

2002

Main work title :

Developments in X-Ray Tomography III

Publisher :

The International Society for Optical Engineering

Pages :

205-212

Peer reviewed :

Peer reviewed

Available on ORBilu :

since 23 April 2013

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