Article (Scientific journals)
When Bad News Become Good News Towards Usable Instances of Learning with Physical Errors
Bellizia, Davide; Hoffmann, Clément; Kamel, Dina et al.
2022In IACR Transactions on Cryptographic Hardware and Embedded Systems, 2022 (4), p. 1--24
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Bellizia, Davide
Hoffmann, Clément
Kamel, Dina
Meaux, Pierrick  ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > PI Coron
Standaert, François-Xavier
External co-authors :
yes
Language :
English
Title :
When Bad News Become Good News Towards Usable Instances of Learning with Physical Errors
Publication date :
2022
Journal title :
IACR Transactions on Cryptographic Hardware and Embedded Systems
Volume :
2022
Issue :
4
Pages :
1--24
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
Available on ORBilu :
since 25 October 2022

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