When Bad News Become Good News Towards Usable Instances of Learning with Physical Errors

Reference : When Bad News Become Good News Towards Usable Instances of Learning with Physical Errors


	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Computer science
	Focus Areas :	Security, Reliability and Trust
	To cite this reference:	http://hdl.handle.net/10993/52557

Title :	When Bad News Become Good News Towards Usable Instances of Learning with Physical Errors
Language :	English
Author, co-author :	Bellizia, Davide [> >]
	Hoffmann, Clément [> >]
	Kamel, Dina [> >]
	Meaux, Pierrick [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > PI Coron]
	Standaert, François-Xavier [> >]
Publication date :	2022
Journal title :	IACR Transactions on Cryptographic Hardware and Embedded Systems
Volume :	2022
Issue/season :	4
Pages :	1--24
Peer reviewed :	Yes
Audience :	International
Permalink :	http://hdl.handle.net/10993/52557
DOI :	10.46586/tches.v2022.i4.1-24
Other URL :	https://doi.org/10.46586/tches.v2022.i4.1-24

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