Article (Scientific journals)
Predicting Patch Correctness Based on the Similarity of Failing Test Cases
TIAN, Haoye; LI, Yinghua; PIAN, Weiguo et al.
2022In ACM Transactions on Software Engineering and Methodology
Peer Reviewed verified by ORBi
 

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Disciplines :
Computer science
Author, co-author :
TIAN, Haoye ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
LI, Yinghua  ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
PIAN, Weiguo ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
KABORE, Abdoul Kader  ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
Liu, Kui
HABIB, Andrew ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
KLEIN, Jacques ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
BISSYANDE, Tegawendé François D Assise  ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX
External co-authors :
yes
Language :
English
Title :
Predicting Patch Correctness Based on the Similarity of Failing Test Cases
Publication date :
2022
Journal title :
ACM Transactions on Software Engineering and Methodology
ISSN :
1049-331X
Publisher :
Association for Computing Machinery (ACM), United States
Peer reviewed :
Peer Reviewed verified by ORBi
European Projects :
H2020 - 949014 - NATURAL - Natural Program Repair
Funders :
CER - Conseil Européen de la Recherche [BE]
CE - Commission Européenne [BE]
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since 26 September 2022

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