Predicting Patch Correctness Based on the Similarity of Failing Test Cases

Reference : Predicting Patch Correctness Based on the Similarity of Failing Test Cases


	Document type :	Scientific journals : Article
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/52239

Title :	Predicting Patch Correctness Based on the Similarity of Failing Test Cases
Language :	English
Author, co-author :	Tian, Haoye [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Li, Yinghua [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Pian, Weiguo [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Kabore, Abdoul Kader [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Liu, Kui []
	Habib, Andrew [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Klein, Jacques [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
	Bissyande, Tegawendé François D Assise [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX >]
Publication date :	2022
Journal title :	ACM Transactions on Software Engineering and Methodology
Publisher :	Association for Computing Machinery (ACM)
Peer reviewed :	Yes
ISSN :	1049-331X
Country :	United States
Funders :	European research council
Target :	Researchers ; Professionals ; Students
Permalink :	http://hdl.handle.net/10993/52239
DOI :	10.1145/3511096
Framework Programme / European Project :	H2020 ; 949014 - NATURAL - Natural Program Repair

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Open access	2022_TOSEM_BATS__Haoye_.pdf		Publisher postprint	1.9 MB	View/Open

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