TIAN, H., LI, Y., PIAN, W., KABORE, A. K., Liu, K., HABIB, A., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases.
ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096
https://hdl.handle.net/10993/52239