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HABIB Andrew

Main Referenced Co-authors
BISSYANDE, Tegawendé  (8)
KLEIN, Jacques  (8)
TIAN, Haoye  (6)
KABORE, Abdoul Kader  (5)
Liu, Kui (4)
Main Referenced Keywords
Software (3); Automatic testcase generation (2); Bug detection (2); Bug reports (2); Search-based software testing (2);
Main Referenced Unit & Research Centers
Interdisciplinary Centre for Security, Reliability and Trust (SnT) > Trustworthy Software Engineering (TruX) (1)
Main Referenced Disciplines
Computer science (9)

Publications (total 9)

The most downloaded
110 downloads
PIAN, W., LI, Y., TIAN, H., SUN, T., SONG, Y., TANG, X., HABIB, A., KLEIN, J., & BISSYANDE, T. (2025). You Don’t Have to Say Where to Edit! jLED – Joint Learning to Localize and Edit Source Code. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3712187 https://hdl.handle.net/10993/64075

The most cited

31 citations (Scopus®)

TIAN, H., LI, Y., PIAN, W., KABORE, A. K., Liu, K., HABIB, A., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096 https://hdl.handle.net/10993/52239

OUEDRAOGO, W. A. M. C., Plein, L., KABORE, A. K., HABIB, A., KLEIN, J., Lo, D., & BISSYANDE, T. F. D. A. (May 2025). Enriching automatic test case generation by extracting relevant test inputs from bug reports. Empirical Software Engineering, 30 (3). doi:10.1007/s10664-025-10635-z
Peer Reviewed verified by ORBi

PIAN, W., LI, Y., TIAN, H., SUN, T., SONG, Y., TANG, X., HABIB, A., KLEIN, J., & BISSYANDE, T. (2025). You Don’t Have to Say Where to Edit! jLED – Joint Learning to Localize and Edit Source Code. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3712187
Peer Reviewed verified by ORBi

OUEDRAOGO, W. A. M. C., Plein, L., KABORE, A. K., HABIB, A., KLEIN, J., Lo, D., & BISSYANDE, T. F. D. A. (2024). Extracting Relevant Test Inputs from Bug Reports for Automatic Test Case Generation. In Proceedings - 2024 ACM/IEEE 46th International Conference on Software Engineering: Companion, ICSE-Companion 2024. IEEE Computer Society. doi:10.1145/3639478.3643537
Editorial reviewed

TANG, X., TIAN, H., Chen, Z., PIAN, W., EZZINI, S., KABORE, A. K., HABIB, A., KLEIN, J., & BISSYANDE, T. F. D. A. (2024). Learning to Represent Patches. In Proceedings - 2024 ACM/IEEE 46th International Conference on Software Engineering: Companion, ICSE-Companion 2024. IEEE Computer Society. doi:10.1145/3639478.3643521
Peer reviewed

TIAN, H., TANG, X., HABIB, A., Wang, S., Liu, K., Xia, X., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness. In Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness.
Peer reviewed

TIAN, H., Liu, K., LI, Y., KABORE, A. K., KOYUNCU, A., HABIB, A., Li, L., Wen, J., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). The Best of Both Worlds: Combining Learned Embeddings with Engineered Features for Accurate Prediction of Correct Patches. ACM Transactions on Software Engineering and Methodology.
Peer Reviewed verified by ORBi

TIAN, H., TANG, X., HABIB, A., Wang, S., Liu, K., Xia, X., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness. In Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness.
Peer reviewed

TIAN, H., LI, Y., PIAN, W., KABORE, A. K., Liu, K., HABIB, A., KLEIN, J., & BISSYANDE, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096
Peer Reviewed verified by ORBi

HABIB, A., Shinnar, A., Hirzel, M., & Pradel, M. (2021). Finding Data Compatibility Bugs with JSON Subschema Checking. In The 30th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA) (pp. 620-632). doi:10.1145/3460319.3464796
Peer reviewed

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