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PIAN Weiguo

University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > TruX

Main Referenced Co-authors
BISSYANDE, Tegawendé  (2)
KLEIN, Jacques  (2)
TIAN, Haoye  (2)
HABIB, Andrew  (1)
Habib, Andrew (1)
Main Referenced Disciplines
Computer science (2)

Publications (total 2)

The most downloaded
29 downloads
Tian, H., Li, Y., Pian, W., Kabore, A. K., Liu, K., Habib, A., Klein, J., & Bissyande, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096 https://hdl.handle.net/10993/52239

The most cited

15 citations (Scopus®)

Tian, H., Li, Y., Pian, W., Kabore, A. K., Liu, K., Habib, A., Klein, J., & Bissyande, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096 https://hdl.handle.net/10993/52239

PIAN, W., Peng, H., TANG, X., SUN, T., TIAN, H., Habib, A., KLEIN, J., & BISSYANDE, T. F. D. A. (February 2023). MetaTPTrans: A Meta Learning Approach for Multilingual Code Representation Learning. Proceedings of the AAAI Conference on Artificial Intelligence, 37 (4), 5239-5247. doi:10.1609/aaai.v37i4.25654
Peer reviewed

Tian, H., Li, Y., Pian, W., Kabore, A. K., Liu, K., Habib, A., Klein, J., & Bissyande, T. F. D. A. (2022). Predicting Patch Correctness Based on the Similarity of Failing Test Cases. ACM Transactions on Software Engineering and Methodology. doi:10.1145/3511096
Peer Reviewed verified by ORBi

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