Reference : The impact of Kelvin probe force microscopy operation modes and environment on grain ...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Physics and Materials Science
http://hdl.handle.net/10993/47809
The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se2 solar cells
English
Martin Lanzoni, Evandro mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Gallet, Thibaut mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Spindler, Conrad mailto [University of Luxembourg > Luxembourg Centre for Systems Biomedicine (LCSB) > LCSB Operations >]
Ramirez Sanchez, Omar mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Kameni Boumenou, Christian mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
Redinger, Alex mailto [University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS) >]
2-Jul-2021
Nano Energy
Elsevier
88
106270
Yes (verified by ORBilu)
International
2211-2855
[en] KPFM ; Perovskite ; CIGS ; Grain boundaries ; Band bending
[en] An in-depth understanding of the electronic properties of grain boundaries (GBs) in polycrystalline semiconductor absorbers is of high importance since their charge carrier recombination rates may be very high and hence limit the solar cell device performance. Kelvin Probe Force Microscopy (KPFM) is the method of choice to investigate GB band bending on the nanometer scale and thereby helps to develop passivation strategies. Here, it is shown that the workfunction, measured with amplitude modulation (AM)-KPFM, which is by far the most common KPFM measurement mode, is prone to exhibit measurement artifacts at grain boundaries on typical solar cell absorbers such as Cu(In,Ga)Se2 and CH3NH3PbI3. This is a direct consequence of a change in the cantilever–sample distance that varies on rough samples. Furthermore, we critically discuss the impact of different environments (air versus vacuum) and show that air exposure alters the GB and facet contrast, which leads to erroneous interpretations of the GB physics. Frequency modulation (FM)-KPFM measurements on non-air-exposed CIGSe and perovskite absorbers show that the amount of band bending measured at the GB is negligible and that the electronic landscape of the semiconductor surface is dominated by facet-related contrast due to the polycrystalline nature of the absorbers.
Fonds National de la Recherche - FnR
GRISC, SUNSPOT
Researchers ; Professionals ; Students ; General public ; Others
http://hdl.handle.net/10993/47809
10.1016/j.nanoen.2021.106270
https://www.sciencedirect.com/science/article/pii/S2211285521005255
FnR ; FNR11696002 > Alex Redinger > GRISC > Grain Boundaries In Solar Cells > 01/07/2018 > 31/12/2021 > 2017

File(s) associated to this reference

Fulltext file(s):

FileCommentaryVersionSizeAccess
Open access
2104.02977 preprint.pdfAuthor preprint30.12 MBView/Open

Bookmark and Share SFX Query

All documents in ORBilu are protected by a user license.