REY, Germain ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Paduthol, Appu; University of New South Wales, Sydney
Sun, Kaiwen; University of New South Wales, Sydney
Nagle, Timothy; theMiaSolé Hi-Tech Corp., Santa Clara, USA
Poplavskyy, Dmitry; theMiaSolé Hi-Tech Corp., Santa Clara, USA
SERRANO ESCALANTE, Valentina ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
MELCHIORRE, Michele ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
SIEBENTRITT, Susanne ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Abbott, Malcolm; University of New South Wales, Sydney
Trupke, Thorsten; University of New South Wales, Sydney
Co-auteurs externes :
yes
Langue du document :
Anglais
Titre :
Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Date de publication/diffusion :
2020
Titre du périodique :
IEEE Journal of Photovoltaics
ISSN :
2156-3381
eISSN :
2156-3403
Maison d'édition :
IEEE Computer Society, Piscataway, Etats-Unis - New Jersey
