Reference : Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells

	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/42626

Title :	Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Language :	English
Author, co-author :	Rey, Germain [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Paduthol, Appu [University of New South Wales, Sydney]
	Sun, Kaiwen [University of New South Wales, Sydney]
	Nagle, Timothy [theMiaSolé Hi-Tech Corp., Santa Clara, USA]
	Poplavskyy, Dmitry [theMiaSolé Hi-Tech Corp., Santa Clara, USA]
	Serrano Escalante, Valentina [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Melchiorre, Michele [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Abbott, Malcolm [University of New South Wales, Sydney]
	Trupke, Thorsten [University of New South Wales, Sydney]
Publication date :	2020
Journal title :	IEEE Journal of Photovoltaics
Publisher :	IEEE Computer Society
Peer reviewed :	Yes (verified by ORBilu)
Audience :	International
ISSN :	2156-3381
e-ISSN :	2156-3403
City :	Piscataway
Country :	NJ
Permalink :	http://hdl.handle.net/10993/42626
DOI :	10.1109/JPHOTOV.2019.2950630

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