Reference : Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/42626
Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
English
Rey, Germain mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Paduthol, Appu [University of New South Wales, Sydney]
Sun, Kaiwen [University of New South Wales, Sydney]
Nagle, Timothy [theMiaSolé Hi-Tech Corp., Santa Clara, USA]
Poplavskyy, Dmitry [theMiaSolé Hi-Tech Corp., Santa Clara, USA]
Serrano Escalante, Valentina mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Melchiorre, Michele mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Abbott, Malcolm [University of New South Wales, Sydney]
Trupke, Thorsten [University of New South Wales, Sydney]
2020
IEEE Journal of Photovoltaics
IEEE Computer Society
Yes
International
2156-3381
2156-3403
Piscataway
NJ
http://hdl.handle.net/10993/42626
10.1109/JPHOTOV.2019.2950630

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