Article (Scientific journals)
Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Rey, Germain; Paduthol, Appu; Sun, Kaiwen et al.
2020In IEEE Journal of Photovoltaics
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Disciplines :
Physics
Author, co-author :
Rey, Germain ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Paduthol, Appu;  University of New South Wales, Sydney
Sun, Kaiwen;  University of New South Wales, Sydney
Nagle, Timothy;  theMiaSolé Hi-Tech Corp., Santa Clara, USA
Poplavskyy, Dmitry;  theMiaSolé Hi-Tech Corp., Santa Clara, USA
Serrano Escalante, Valentina ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Melchiorre, Michele ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Siebentritt, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Abbott, Malcolm;  University of New South Wales, Sydney
Trupke, Thorsten;  University of New South Wales, Sydney
External co-authors :
yes
Language :
English
Title :
Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells
Publication date :
2020
Journal title :
IEEE Journal of Photovoltaics
ISSN :
2156-3403
Publisher :
IEEE Computer Society, Piscataway, United States - New Jersey
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 25 February 2020

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