Can deep defects limit the open circuit voltage in Cu(In,Ga)Se2?

Reference : Can deep defects limit the open circuit voltage in Cu(In,Ga)Se2?


	Document type :	Scientific congresses, symposiums and conference proceedings : Poster
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	Focus Areas :	Physics and Materials Science
	To cite this reference:	http://hdl.handle.net/10993/41321

Title :	Can deep defects limit the open circuit voltage in Cu(In,Ga)Se2?
Language :	English
Author, co-author :	Spindler, Conrad [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit]
Publication date :	2017
Peer reviewed :	No
Audience :	International
Event name :	MRS Spring Meeting
Event date :	17-04-2017 to 21-04-2017
Event place (city) :	Phoenix
Event country :	AZ
Permalink :	http://hdl.handle.net/10993/41321

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Open access	CIGSe-Defects-Voc.pdf		Author preprint	1.01 MB	View/Open

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