Article (Scientific journals)
Can we see defects in capacitance measurements of thin‐film solar cells ?
Werner, Florian; Babbe, Finn; Elanzeery, Hossam et al.
2019In Progress in Photovoltaics, 27, p. 1045–1058
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Disciplines :
Physics
Author, co-author :
Werner, Florian ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Babbe, Finn ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Elanzeery, Hossam ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Siebentritt, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
External co-authors :
yes
Language :
English
Title :
Can we see defects in capacitance measurements of thin‐film solar cells ?
Publication date :
2019
Journal title :
Progress in Photovoltaics
ISSN :
1099-159X
Publisher :
John Wiley & Sons, Hoboken, United States - New Jersey
Volume :
27
Pages :
1045–1058.
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 01 December 2019

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