Reference : Can we see defects in capacitance measurements of thin‐film solar cells ?
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/41081
Can we see defects in capacitance measurements of thin‐film solar cells ?
English
Werner, Florian mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Babbe, Finn mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Elanzeery, Hossam mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
2019
Progress in Photovoltaics
John Wiley & Sons
27
1045–1058.
Yes (verified by ORBilu)
International
1062-7995
1099-159X
Hoboken
NJ
http://hdl.handle.net/10993/41081
10.1002/pip.3196

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