Reference : Early-stage topological and technological choices for TSN-based communication archite...
Scientific congresses, symposiums and conference proceedings : Unpublished conference
Engineering, computing & technology : Electrical & electronics engineering
Security, Reliability and Trust
Early-stage topological and technological choices for TSN-based communication architectures
Navet, Nicolas mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Villanueva, Josetxo [Groupe Renault]
Migge, Jörn [RealTime-at-Work]
2019 IEEE Standards Association (IEEE-SA) Ethernet & IP @ Automotive Technology Day
from 24-09-2019 to 25-09-2019
IEEE Standards Association
[en] In-vehicle networks ; Time Sensitive Networking ; early-stage design choices ; Artificial data ; Design Space Exploration ; Service Oriented Architecture ; E/E architectures
[en] A main issue in the design of automotive communication architectures is that the most important design choices pertaining to the topology of the networks and the technologies to use (protocols, data rate, hardware) have to be made at a time when the communication requirements are not entirely known. Indeed, many functions only becomes available along the development cycle, and vehicle platforms have to support incremental evolutions of the embedded system that may not be fully foreseeable at the time design choices are made. The problem is becoming even more difficult and crucial with the introduction of dynamically evolving communication requirements requiring network re-configuration at run-time.
We present how the use of synthetic data, that is data generated programmatically based on past vehicle projects and what can be foreseen for the current project, enables the designers to make such early stage choices based on quantified metrics. The proposals are applied to Groupe Renault's FACE service-oriented E/E architecture with the use of a software-implemented function we called “Topology Stress Test”.
Researchers ; Professionals ; Students

File(s) associated to this reference

Fulltext file(s):

Open access
ieee-Ethernet-Tech-Days_2019.pdfAuthor postprint2.56 MBView/Open

Bookmark and Share SFX Query

All documents in ORBilu are protected by a user license.