Paper published in a book (Scientific congresses, symposiums and conference proceedings)
HITECS: A UML Profile and Analysis Framework for Hardware-in-the-Loop Testing of Cyber Physical Systems
Shin, Seung Yeob; Chaouch, Karim; Nejati, Shiva et al.
2018In Proceedings of ACM/IEEE 21st International Conference on Model Driven Engineering Languages and Systems (MODELS’18)
Peer reviewed
 

Files


Full Text
p357-shin.pdf
Author postprint (1.06 MB)
Download

All documents in ORBilu are protected by a user license.

Send to



Details



Keywords :
Test Case Specification and Analysis; Cyber Physical Systems; UML Profile; Model Checking and Simulation; JavaPathFinder
Abstract :
[en] Hardware-in-the-loop (HiL) testing is an important step in the development of cyber physical systems (CPS). CPS HiL test cases manipulate hardware components, are time-consuming and their behaviors are impacted by the uncertainties in the CPS environment. To mitigate the risks associated with HiL testing, engineers have to ensure that (1) HiL test cases are well-behaved, i.e., they implement valid test scenarios and do not accidentally damage hardware, and (2) HiL test cases can execute within the time budget allotted to HiL testing. This paper proposes an approach to help engineers systematically specify and analyze CPS HiL test cases. Leveraging the UML profile mechanism, we develop an executable domain-specific language, HITECS, for HiL test case specification. HITECS builds on the UML Testing Profile (UTP) and the UML action language (Alf). Using HITECS, we provide analysis methods to check whether HiL test cases are well-behaved, and to estimate the execution times of these test cases before the actual HiL testing stage. We apply HITECS to an industrial case study from the satellite domain. Our results show that: (1) HITECS is feasible to use in practice; (2) HITECS helps engineers define more complete and effective well-behavedness assertions for HiL test cases, compared to when these assertions are defined without systematic guidance; (3) HITECS verifies in practical time that HiL test cases are well-behaved; and (4) HITECS accurately estimates HiL test case execution times.
Research center :
Interdisciplinary Centre for Security, Reliability and Trust (SnT) > Software Verification and Validation Lab (SVV Lab)
Disciplines :
Computer science
Author, co-author :
Shin, Seung Yeob ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Chaouch, Karim ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Nejati, Shiva ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Sabetzadeh, Mehrdad ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Briand, Lionel ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Zimmer, Frank;  SES Networks
External co-authors :
no
Language :
English
Title :
HITECS: A UML Profile and Analysis Framework for Hardware-in-the-Loop Testing of Cyber Physical Systems
Publication date :
October 2018
Event name :
ACM/IEEE International Conference on Model Driven Engineering Languages and Systems
Event place :
Copenhagen, Denmark
Event date :
from 14-10-2018 to 19-10-2018
Audience :
International
Main work title :
Proceedings of ACM/IEEE 21st International Conference on Model Driven Engineering Languages and Systems (MODELS’18)
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
European Projects :
H2020 - 694277 - TUNE - Testing the Untestable: Model Testing of Complex Software-Intensive Systems
FnR Project :
FNR11270448 - Model-based Simulation Of Integrated Software Systems, 2016 (01/01/2017-31/12/2019) - Lionel Briand
Funders :
CE - Commission Européenne [BE]
Available on ORBilu :
since 06 July 2018

Statistics


Number of views
384 (93 by Unilu)
Number of downloads
342 (45 by Unilu)

Scopus citations®
 
6
Scopus citations®
without self-citations
4
OpenCitations
 
3
WoS citations
 
5

Bibliography


Similar publications



Contact ORBilu