Title : Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers Language : English Author, co-author : Weiss, Thomas [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] Rey, Germain [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] Schwarz, Torsten [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany] Spies, Maria [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany] Cojocura-Mir edin, Oana [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany] Choi, P. P. [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany] Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] Publication date : Jul-2016 Journal title : Journal of Applied Physics Publisher : American Institute of Physics Volume : 120 Pages : 045703 Peer reviewed : Yes (verified by ORBilu ) Audience : International ISSN : 0021-8979 e-ISSN : 1089-7550 City : Melville Country : NY Permalink : http://hdl.handle.net/10993/28142 DOI : 10.1063/1.4959611 
[University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
