Title : Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers
Language : English
Author, co-author : Weiss, Thomas [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Rey, Germain [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Schwarz, Torsten [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Spies, Maria [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Cojocura-Mir edin, Oana [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Choi, P. P. [Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany]
Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date : Jul-2016
Journal title : Journal of Applied Physics
Publisher : American Institute of Physics
Volume : 120
Pages : 045703
Peer reviewed : Yes (verified by ORBilu )
Audience : International
ISSN : 0021-8979
e-ISSN : 1089-7550
City : Melville
Country : NY
Permalink : http://hdl.handle.net/10993/28142
DOI : 10.1063/1.4959611