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Article (Scientific journals)
Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers
WEISS, Thomas; REDINGER, Alex; REY, Germain et al.
2016 • In Journal of Applied Physics, 120, p. 045703
Peer Reviewed verified by ORBi
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https://hdl.handle.net/10993/28142
DOI
10.1063/1.4959611
 

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Disciplines :
Physics
Author, co-author :
WEISS, Thomas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REDINGER, Alex ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REY, Germain ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Schwarz, Torsten;  Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
Spies, Maria;  Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
Cojocura-Mir edin, Oana;  Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
Choi, P. P.;  Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
SIEBENTRITT, Susanne ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
External co-authors :
yes
Language :
English
Title :
Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers
Publication date :
July 2016
Journal title :
Journal of Applied Physics
ISSN :
0021-8979
eISSN :
1089-7550
Publisher :
American Institute of Physics, Melville, United States - New York
Volume :
120
Pages :
045703
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 09 August 2016

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