Reference : Approaching the DT Bound Using Linear Codes in the Short Blocklength Regime |
Scientific journals : Article | |||
Engineering, computing & technology : Electrical & electronics engineering | |||
Security, Reliability and Trust | |||
http://hdl.handle.net/10993/26637 | |||
Approaching the DT Bound Using Linear Codes in the Short Blocklength Regime | |
English | |
Salamanca Mino, Luis ![]() | |
Murillo-Fuentes, Juan José ![]() | |
Martinez-Olmos, Pablo ![]() | |
Pérez-Cruz, Fernando ![]() | |
Verdú, Sergio [Princeton University > Information Sciences and Systems group] | |
Feb-2015 | |
IEEE Communications Letters | |
Institute of Electrical and Electronics Engineers | |
19 | |
123-126 | |
Yes (verified by ORBilu) | |
International | |
1089-7798 | |
New York | |
NY | |
[en] LDPC codes ; Finite blocklength regime ; ML decoding ; Binary erasure channel ; Random Coding | |
[en] The dependence-testing (DT) bound is one of the
strongest achievability bounds for the binary erasure channel (BEC) in the finite block length regime. In this paper, we show that maximum likelihood decoded regular low-density parity-check (LDPC) codes with at least 5 ones per column almost achieve the DT bound. Specifically, using quasi-regular LDPC codes with block length of 256 bits, we achieve a rate that is less than 1% away from the rate predicted by the DT bound for a word error rate below 10^−3. The results also indicate that the maximum-likelihood solution is computationally feasible for decoding block codes over the BEC with several hundred bits. | |
Luxembourg Centre for Systems Biomedicine (LCSB) | |
http://hdl.handle.net/10993/26637 | |
10.1109/LCOMM.2014.2371032 |
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