Reference : Schottky Barriers and Ohmic Contacts on InGaAs, Properties of Lattice-matched and str... |
Scientific journals : Article | |||
Engineering, computing & technology : Electrical & electronics engineering | |||
http://hdl.handle.net/10993/20752 | |||
Schottky Barriers and Ohmic Contacts on InGaAs, Properties of Lattice-matched and strained InGaAs | |
English | |
Kordoš, P. [Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany] | |
Marso, Michel ![]() | |
1993 | |
EMS Datareviews | |
INSPEC IEE London | |
131-155 | |
Yes | |
http://hdl.handle.net/10993/20752 |
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