Microwave Properties of the MSM Photodetectors with 2-DEG

Tomáška, M.; MARSO, Michel; Fox, A.; Kordoš, P.

doi:10.1109/ASDAM.1998.730221

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Microwave Properties of the MSM Photodetectors with 2-DEG

Tomáška, M.; MARSO, Michel; Fox, A. et al.

1998 • In Proc. 2nd International Conference on Advanced Semiconductor Devices and Microsystems

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https://hdl.handle.net/10993/20660

DOI
10.1109/ASDAM.1998.730221

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Disciplines :

Electrical & electronics engineering

Identifiers :

UNILU:UL-CONFERENCE-2009-401

Author, co-author :

Tomáška, M.

MARSO, Michel ; Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

Fox, A.; Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

Kordoš, P.; Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

External co-authors :

yes

Language :

English

Title :

Microwave Properties of the MSM Photodetectors with 2-DEG

Publication date :

1998

Event name :

2nd International Conference on Advanced Semiconductor Devices and Microsystems

Event date :

1998

Main work title :

Proc. 2nd International Conference on Advanced Semiconductor Devices and Microsystems

Pages :

295-298

Available on ORBilu :

since 29 March 2015

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