Reference : Microwave Properties of the MSM Photodetectors with 2-DEG |
Scientific congresses, symposiums and conference proceedings : Paper published in a book | |||
Engineering, computing & technology : Electrical & electronics engineering | |||
http://hdl.handle.net/10993/20660 | |||
Microwave Properties of the MSM Photodetectors with 2-DEG | |
English | |
Tomáška, M. [> >] | |
Marso, Michel ![]() | |
Fox, A. [Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany] | |
Kordoš, P. [Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany] | |
1998 | |
Proc. 2nd International Conference on Advanced Semiconductor Devices and Microsystems | |
295-298 | |
No | |
2nd International Conference on Advanced Semiconductor Devices and Microsystems | |
1998 | |
http://hdl.handle.net/10993/20660 |
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