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Microwave Properties of the MSM Photodetectors with 2-DEG
Tomáška, M.; MARSO, Michel; Fox, A. et al.
1998In Proc. 2nd International Conference on Advanced Semiconductor Devices and Microsystems
 

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Disciplines :
Electrical & electronics engineering
Identifiers :
UNILU:UL-CONFERENCE-2009-401
Author, co-author :
Tomáška, M.
MARSO, Michel ;  Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Fox, A.;  Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Kordoš, P.;  Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
External co-authors :
yes
Language :
English
Title :
Microwave Properties of the MSM Photodetectors with 2-DEG
Publication date :
1998
Event name :
2nd International Conference on Advanced Semiconductor Devices and Microsystems
Event date :
1998
Main work title :
Proc. 2nd International Conference on Advanced Semiconductor Devices and Microsystems
Pages :
295-298
Available on ORBilu :
since 29 March 2015

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