Article (Scientific journals)
A cost-effective atomic force microscope for undergraduate control laboratories
Jones, C. N.; Goncalves, Jorge
2010In IEEE Transactions on Education, 53 (2), p. 328-334
Peer Reviewed verified by ORBi


Full Text
A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories.pdf
Publisher postprint (536.38 kB)
Request a copy

All documents in ORBilu are protected by a user license.

Send to


Keywords :
Atomic force microscope (AFM); control; microscopy; system identification; teaching laboratory
Abstract :
[en] This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to see. All of the parts but one are off the shelf, and assembly time is generally less than two days, which makes the microscope a robust instrument that is readily handled by the students with little chance of damage. While the scanning resolution is nowhere near that of a commercial instrument, it is more than sufficient to take interesting scans of micrometer-scale objects. A survey of students after their having used the AFM resulted in a generally good response, with 80% agreeing that they had a positive learning experience.
Disciplines :
Engineering, computing & technology: Multidisciplinary, general & others
Author, co-author :
Jones, C. N.
Goncalves, Jorge ;  University of Luxembourg > Luxembourg Centre for Systems Biomedicine (LCSB)
Language :
Title :
A cost-effective atomic force microscope for undergraduate control laboratories
Publication date :
May 2010
Journal title :
IEEE Transactions on Education
Publisher :
Volume :
Issue :
Pages :
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 10 March 2015


Number of views
101 (0 by Unilu)
Number of downloads
0 (0 by Unilu)

Scopus citations®
Scopus citations®
without self-citations
WoS citations


Similar publications

Contact ORBilu