Article (Scientific journals)
Temperature-dependence of the phase-coherence length in InN nanowires
Blömers, Ch; Schäpers, Th; Richter, T. et al.
2008In Applied Physics Letters, 92 (13), p. 132101-132103
Peer reviewed
 

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Abstract :
[en] We report on low-temperature magnetotransport measurements on InN nanowires, grown by plasma-assisted molecular beam epitaxy. The characteristic fluctuation pattern observed in the conductance was employed to obtain information on phase-coherent transport. By analyzing the root mean square and the correlation field of the conductance fluctuations at various temperatures, the phase-coherence length was determined.
Disciplines :
Electrical & electronics engineering
Identifiers :
UNILU:UL-ARTICLE-2009-237
Author, co-author :
Blömers, Ch ;  Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Schäpers, Th;  Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Richter, T. ;  Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Calarco, Raffaella;  Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Lüth, H.;  Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Marso, Michel ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit ; Institute for Bio- and Nanosystems (IBN-1) and JARA Jülich-Aachen Research Alliance, Research Centre Jülich GmbH, 52425 Jülich, Germany
Language :
English
Title :
Temperature-dependence of the phase-coherence length in InN nanowires
Publication date :
2008
Journal title :
Applied Physics Letters
ISSN :
0003-6951
Publisher :
American Institute of Physics, Melville, United States - New York
Volume :
92
Issue :
13
Pages :
132101-132103
Peer reviewed :
Peer reviewed
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