Paper published in a book (Scientific congresses, symposiums and conference proceedings)
Mutation-based Generation of Software Product Line Test Configurations
Henard, Christopher; Papadakis, Mike; Le Traon, Yves
2014In Symposium on Search-Based Software Engineering (SSBSE 2014)
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Henard, Christopher ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Papadakis, Mike ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
no
Language :
English
Title :
Mutation-based Generation of Software Product Line Test Configurations
Publication date :
2014
Event name :
Symposium on Search-Based Software Engineering (SSBSE 2014)
Event date :
26-08-2014 to 29-08-2014
Main work title :
Symposium on Search-Based Software Engineering (SSBSE 2014)
Publisher :
Springer
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 12 November 2014

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