Mutation-based Generation of Software Product Line Test Configurations

Reference : Mutation-based Generation of Software Product Line Test Configurations


	Document type :	Scientific congresses, symposiums and conference proceedings : Paper published in a book
	Discipline(s) :	Engineering, computing & technology : Computer science
	To cite this reference:	http://hdl.handle.net/10993/18769

Title :	Mutation-based Generation of Software Product Line Test Configurations
Language :	English
Author, co-author :	Henard, Christopher [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
	Papadakis, Mike [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
	Le Traon, Yves [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Publication date :	2014
Main document title :	Symposium on Search-Based Software Engineering (SSBSE 2014)
Publisher :	Springer
Peer reviewed :	Yes
Event name :	Symposium on Search-Based Software Engineering (SSBSE 2014)
Event date :	26-08-2014 to 29-08-2014
Permalink :	http://hdl.handle.net/10993/18769

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