Infrared-Nanoscopy of Surface Patterns in Mixed Polymer Brushes

Reference : Infrared-Nanoscopy of Surface Patterns in Mixed Polymer Brushes


	Document type :	Scientific congresses, symposiums and conference proceedings : Paper published in a journal
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/18233

Title :	Infrared-Nanoscopy of Surface Patterns in Mixed Polymer Brushes
Language :	English
Author, co-author :	Filimon, Marlena [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	2009
Journal title :	Biophysical Journal
Publisher :	Elsevier
Volume :	96
Issue/season :	3
Pages :	639a
Peer reviewed :	Yes (verified by ORBi^lu)
Audience :	International
ISSN :	0006-3495
e-ISSN :	1542-0086
Country :	MD
Event name :	53th Annual meeting- Biophysical Society, 2009, Boston, USA
Event date :	27-02-2009 to 04-03-2009
Event organizer :	Biophysical Society
Event place (city) :	Boston
Event country :	US
Keywords :	[en] atomic force microscope ; infrared spectroscopy
Abstract :	[en] A near field microscope incorporating vibrational spectroscopy as a contrast mechanism would allow chemical mapping in the so called “fingerprint region”, with the high spatial resolution of SNOM [2-4]. Using a scattering scanning near-field microscope (s-SNIM) allows us to simultaneously record topography and frequency-dependent near-field signal of organic and biological samples with sub-diffraction limited resolution of up to 90 nm.
Target :	Researchers ; Professionals ; Students ; General public
Permalink :	http://hdl.handle.net/10993/18233
DOI :	10.1016/j.bpj.2008.12.3378

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