Article (Scientific journals)
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles et al.
2014In IEEE Transactions on Software Engineering, 40 (7), p. 650-670
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Henard, Christopher ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Papadakis, Mike ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Perrouin, Gilles ;  University of Namur
Klein, Jacques ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Heymans, Patrick;  University of Namur
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
yes
Language :
English
Title :
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Configurations for Software Product Lines
Publication date :
2014
Journal title :
IEEE Transactions on Software Engineering
ISSN :
0098-5589
Publisher :
IEEE
Volume :
40
Issue :
7
Pages :
650-670
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 28 May 2014

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