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Effective Fault Localization via Mutation Analysis: A Selective Mutation Approach
Papadakis, Mike; Le Traon, Yves
2014In ACM Symposium On Applied Computing (SAC'14)
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Papadakis, Mike ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
no
Language :
English
Title :
Effective Fault Localization via Mutation Analysis: A Selective Mutation Approach
Publication date :
2014
Event name :
29th ACM Symposium On Applied Computing
Event date :
March 24 - 28, 2014
Main work title :
ACM Symposium On Applied Computing (SAC'14)
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 27 May 2014

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