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Selective Test Generation Method for Evolving Critical Systems
Fourneret, Elizabeta; Bouquet, Fabrice; Dadeau, Frédéric et al.
2011In Proceedings of 4th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW 2011), p. 125-134
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Keywords :
Dependence Analysis; Evolution; Model-Based Testing; Regression; Stagnation; Tests life cycle
Abstract :
[en] We present in this paper the implementation of a model-based testing technique for evolving systems. These latters are described in UML using class/object diagrams and state charts, augmented with OCL constraints. Based on two versions of a given model, an automated process deduces the impact of model evolutions on the existing tests. Our methodology then classifies tests into different test suites to test evolution, regression, stagnation and deletion on the concrete system. We introduce the notion of tests and test suites life cycles that help defining the purpose of each test at a given step of the system evolution, and thus, their classification in different test suites. The approach is illustrated on a realistic case study, and the improvements w.r.t. other regression testing techniques are discussed.
Disciplines :
Computer science
Identifiers :
UNILU:UL-CONFERENCE-2013-049
Author, co-author :
Fourneret, Elizabeta ;  LIFC INRIA CASSIS Project, Univ. de Franche-Comte, Besancon, France
Bouquet, Fabrice
Dadeau, Frédéric
Debricon, Stéphane
Language :
English
Title :
Selective Test Generation Method for Evolving Critical Systems
Publication date :
2011
Event name :
IEEE International Conference on Software Testing, Verification and Validation
Event date :
from 21-03-2011 to 25-03-2011
Audience :
International
Journal title :
Proceedings of 4th IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW 2011)
Publisher :
IEEE Computer Society
Pages :
125-134
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 31 October 2013

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