Reference : Charge and doping distributions by capacitance profiling in Cu(In,Ga)Se2 solar cells

	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	To cite this reference:	http://hdl.handle.net/10993/8632

Title :	Charge and doping distributions by capacitance profiling in Cu(In,Ga)Se2 solar cells
Language :	English
Author, co-author :	Cwil, Michael [> >]
	Igalson, Malgorzata [> >]
	Zabierowski, Powel [> >]
	Siebentritt, Susanne [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Publication date :	2008
Journal title :	Journal of Applied Physics
Publisher :	American Institute of Physics
Volume :	103
Pages :	063701-063701-9
Peer reviewed :	Yes (verified by ORBilu)
ISSN :	0021-8979
Permalink :	http://hdl.handle.net/10993/8632
DOI :	10.1063/1.2884708
Other URL :	http://link.aip.org/link/?JAPIAU/103/063701/1

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