Charge and doping distributions by capacitance profiling in Cu(In,Ga)Se2 solar cells

Cwil, Michael; Igalson, Malgorzata; Zabierowski, Powel; Siebentritt, Susanne

doi:10.1063/1.2884708

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Charge and doping distributions by capacitance profiling in Cu(In,Ga)Se2 solar cells

Cwil, Michael; Igalson, Malgorzata; Zabierowski, Powel et al.

2008 • In Journal of Applied Physics, 103, p. 063701-063701-9

Peer reviewed

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https://hdl.handle.net/10993/8632

DOI
10.1063/1.2884708

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Disciplines :

Physics

Identifiers :

UNILU:UL-ARTICLE-2009-491

Author, co-author :

Cwil, Michael

Igalson, Malgorzata

Zabierowski, Powel

Siebentritt, Susanne ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit

Language :

English

Title :

Charge and doping distributions by capacitance profiling in Cu(In,Ga)Se2 solar cells

Publication date :

2008

Journal title :

Journal of Applied Physics

ISSN :

0021-8979

Publisher :

American Institute of Physics

Volume :

103

Pages :

063701-063701-9

Peer reviewed :

Peer reviewed

Additional URL :

http://link.aip.org/link/?JAPIAU/103/063701/1

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