Article (Scientific journals)
A general parametric Stein characterization
LEY, Christophe; Swan, Yvik
2016In Statistics and Probability Letters, 111, p. 67 - 71
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Keywords :
Parametric distributions; Stein operators; Stein's method; Statistics and Probability; Statistics, Probability and Uncertainty
Abstract :
[en] We present a general characterization theorem for parametric probability distributions in terms of a differential operator akin to the so-called Stein operators from the literature on Stein's method.
Disciplines :
Mathematics
Author, co-author :
LEY, Christophe ;  University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Mathematics (DMATH) ; Ghent University, Department of Applied Mathematics, Computer Science and Statistics, Ghent, Belgium
Swan, Yvik;  Université de Liège, Département de mathématique, Sart Tilman, Liège, Belgium
External co-authors :
yes
Language :
English
Title :
A general parametric Stein characterization
Publication date :
April 2016
Journal title :
Statistics and Probability Letters
ISSN :
0167-7152
Publisher :
Elsevier
Volume :
111
Pages :
67 - 71
Peer reviewed :
Peer Reviewed verified by ORBi
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