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Validity fuzzing and parametric generators for effective random testing
Padhye, Rohan; Lemieux, Caroline; Sen, Koushik et al.
2019In 2019 IEEE/ACM 41st International Conference on Software Engineering: Companion Proceedings (ICSE-Companion), p. 266–267
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Padhye, Rohan
Lemieux, Caroline
Sen, Koushik
PAPADAKIS, Mike ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > SerVal
LE TRAON, Yves ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > SerVal
External co-authors :
yes
Language :
English
Title :
Validity fuzzing and parametric generators for effective random testing
Publication date :
2019
Event name :
Published in: 2019 IEEE/ACM 41st International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
Event date :
25-31 May 2019
Journal title :
2019 IEEE/ACM 41st International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
Pages :
266–267
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 22 November 2023

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