Nanomechanical Spectroscopy of 2D Materials

[en] We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a high Q silicon nitride nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast ($\tau$rise∼135 ns), sensitive (noise-equivalent power = 90 pW/√Hz), and broadband (1.2-3.1 eV, extendable to UV-THz) method provides an attractive alternative to spectroscopic or ellipsometric characterization techniques.

Disciplines :

Physics

Author, co-author :

Kirchhof, Jan N.

Yu, Yuefeng

Antheaume, Gabriel

Gordeev, Georgy ; University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS)

Yagodkin, Denis

Elliott, Peter

De Araújo, Daniel B.

Sharma, Sangeeta

Reich, Stephanie

Bolotin, Kirill I.

External co-authors :

yes

Language :

English

Title :

Nanomechanical Spectroscopy of 2D Materials

Publication date :

2022

Journal title :

Nano Letters

ISSN :

1530-6992

Publisher :

American Chemical Society, Washington, United States - District of Columbia

Volume :

Issue :

Pages :

8037--8044

Peer reviewed :

Peer Reviewed verified by ORBi

Additional URL :

https://pubs.acs.org/doi/10.1021/acs.nanolett.2c01289

Available on ORBilu :

since 03 January 2023

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