[en] We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a high Q silicon nitride nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast ($\tau$rise∼135 ns), sensitive (noise-equivalent power = 90 pW/√Hz), and broadband (1.2-3.1 eV, extendable to UV-THz) method provides an attractive alternative to spectroscopic or ellipsometric characterization techniques.
Disciplines :
Physique
Auteur, co-auteur :
Kirchhof, Jan N.
Yu, Yuefeng
Antheaume, Gabriel
GORDEEV, Georgy ; University of Luxembourg > Faculty of Science, Technology and Medicine (FSTM) > Department of Physics and Materials Science (DPHYMS)
Yagodkin, Denis
Elliott, Peter
De Araújo, Daniel B.
Sharma, Sangeeta
Reich, Stephanie
Bolotin, Kirill I.
Co-auteurs externes :
yes
Langue du document :
Anglais
Titre :
Nanomechanical Spectroscopy of 2D Materials
Date de publication/diffusion :
2022
Titre du périodique :
Nano Letters
ISSN :
1530-6984
eISSN :
1530-6992
Maison d'édition :
American Chemical Society, Washington, Etats-Unis - District de Columbia
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