perovskite; kelvin probe force microscopy; surface photovoltage
Résumé :
[en] Careful surface analysis is essential to understand the electronic and ionic behaviors in perovskite absorbers. In this contribution we discuss Kelvin probe force microscopy performed in ultra-high vacuum on as-grown and annealed co-evaporated methylammonium lead iodide perovskite thin films. By comparing the contact potential difference upon annealing and illumination, we find that annealing increases the average workfunction, indicating a change either in doping or in surface composition. Illumination also increases the average workfunction, indicating a p-type absorber, by reducing band bending as the photo-generated carriers screen the surface states. The effect of light shows a two-step process, with a first fast trend, linked to the surface photovoltage and a second slower trend indicating a possible redistribution of mobile charges.
Disciplines :
Physique
Auteur, co-auteur :
GALLET, Thibaut ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
MARTIN LANZONI, Evandro ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
REDINGER, Alex ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit
Co-auteurs externes :
no
Langue du document :
Anglais
Titre :
Effects of Annealing and Light on Co-evaporated Methylammonium Lead Iodide Perovskites using Kelvin Probe Force Microscopy in Ultra-High Vacuum
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