2015 - Salomão et al. - Determination of High-Frequency Dielectric Constant and Surface Potential of graphene oxide and influence of humidity by Kelvin Probe Force Microscopy.pdf
[en] We use Kelvin probe force microscopy (KPFM) and capacitance coupling (dC/dz) to study the electrical properties of graphene oxide (GO). We propose using the dC/dz signal to probe the high frequency dielectric constant of mono- and few-layer GO. Our measurements suggest that the dynamic dielectric constant of GO is on the order of εGO ? 3.0 ε0, in the high frequency limit, and independent of the number of GO layers. The measurements are performed at a humidity controlled environment (5 of humidity). The effects of increasing humidity on both the dC/dz and KPFM measurements are analyzed.
Disciplines :
Physique
Auteur, co-auteur :
Salomão, Francisco Carneiro; Universidade Federal do Ceará > Departmento de Física
MARTIN LANZONI, Evandro ; Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia
Costa, Carlos; Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia
Deneke, Christoph; Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia
Barros, Eduardo Bedê; Universidade Federal do Ceará > Departmento de Física
Co-auteurs externes :
no
Langue du document :
Anglais
Titre :
Determination of High Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by KPFM.
