Reference : Determination of High Frequency Dielectric Constant and Surface Potential of Graphene...
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
Physics and Materials Science
http://hdl.handle.net/10993/41875
Determination of High Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by KPFM.
English
Salomão, Francisco Carneiro [Universidade Federal do Ceará > Departmento de Física]
Martin Lanzoni, Evandro mailto [Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia]
Costa, Carlos [Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia]
Deneke, Christoph [Centro Nacional de Pesquisa em Energia e Materiais > Laboratório Nacional de Nanotecnologia]
Barros, Eduardo Bedê [Universidade Federal do Ceará > Departmento de Física]
2015
Langmuir
Yes (verified by ORBilu)
0743-7463
[en] We use Kelvin probe force microscopy (KPFM) and capacitance coupling (dC/dz) to study the electrical properties of graphene oxide (GO). We propose using the dC/dz signal to probe the high frequency dielectric constant of mono- and few-layer GO. Our measurements suggest that the dynamic dielectric constant of GO is on the order of εGO ? 3.0 ε0, in the high frequency limit, and independent of the number of GO layers. The measurements are performed at a humidity controlled environment (5 of humidity). The effects of increasing humidity on both the dC/dz and KPFM measurements are analyzed.
http://hdl.handle.net/10993/41875
10.1021/acs.langmuir.5b01786
http://pubs.acs.org/doi/abs/10.1021/acs.langmuir.5b01786
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