Paper published in a book (Scientific congresses, symposiums and conference proceedings)
Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Papadakis, Mike; Shin, Donghwan; Yoo, Shin et al.
2018In 40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden
Peer reviewed
 

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Disciplines :
Computer science
Author, co-author :
Papadakis, Mike ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Shin, Donghwan
Yoo, Shin
Bae, Doo-Hwan
External co-authors :
yes
Language :
English
Title :
Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Publication date :
2018
Event name :
40th International Conference on Software Engineering (ICSE'18)
Event date :
from 27-5-2018 t0 3-6-2018
Audience :
International
Main work title :
40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
Available on ORBilu :
since 19 February 2018

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