PAPADAKIS, Mike ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Shin, Donghwan
Yoo, Shin
Bae, Doo-Hwan
Co-auteurs externes :
yes
Langue du document :
Anglais
Titre :
Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults
Date de publication/diffusion :
2018
Nom de la manifestation :
40th International Conference on Software Engineering (ICSE'18)
Date de la manifestation :
from 27-5-2018 t0 3-6-2018
Manifestation à portée :
International
Titre de l'ouvrage principal :
40th International Conference on Software Engineering, May 27 - 3 June 2018, Gothenburg, Sweden
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