Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

Hages, Charles J.; REDINGER, Alex; Levcenko, Sergiu; Hempel, Hannes; Koeper, Mark J.; Agrawal, Rakesh; Greier, Dieter; Kaufmann, Christian A.; Unold, Thomas

doi:10.1002/aenm.201700167

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Article (Scientific journals)

Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

Hages, Charles J.; REDINGER, Alex; Levcenko, Sergiu et al.

2017 • In Advanced Energy Materials

Peer Reviewed verified by ORBi

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https://hdl.handle.net/10993/33036

DOI
10.1002/aenm.201700167

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Disciplines :

Physics

Author, co-author :

Hages, Charles J.

REDINGER, Alex ; University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit

Levcenko, Sergiu

Hempel, Hannes

Koeper, Mark J.

Agrawal, Rakesh

Greier, Dieter

Kaufmann, Christian A.

Unold, Thomas

External co-authors :

yes

Language :

English

Title :

Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

Publication date :

2017

Journal title :

Advanced Energy Materials

ISSN :

1614-6832

eISSN :

1614-6840

Publisher :

Wiley, Weinheim, Germany

Peer reviewed :

Peer Reviewed verified by ORBi

Focus Area :

Physics and Materials Science

Available on ORBilu :

since 15 November 2017

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