| Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials |
| English |
| Hages, Charles J. [] |
| Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >] |
| Levcenko, Sergiu [] |
| Hempel, Hannes [] |
| Koeper, Mark J. [] |
| Agrawal, Rakesh [] |
| Greier, Dieter [] |
| Kaufmann, Christian A. [] |
| Unold, Thomas [] |
| 2017 |
| Advanced Energy Materials |
| Wiley |
| Yes (verified by ORBilu) |
| International |
| 1614-6832 |
| 1614-6840 |
| Weinheim |
| Germany |
| http://hdl.handle.net/10993/33036 |
| 10.1002/aenm.201700167 |