Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

Reference : Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Stu...


	Document type :	Scientific journals : Article
	Discipline(s) :	Physical, chemical, mathematical & earth Sciences : Physics
	Focus Areas :	Physics and Materials Science
	To cite this reference:	http://hdl.handle.net/10993/33036

Title :	Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials
Language :	English
Author, co-author :	Hages, Charles J. []
	Redinger, Alex [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
	Levcenko, Sergiu []
	Hempel, Hannes []
	Koeper, Mark J. []
	Agrawal, Rakesh []
	Greier, Dieter []
	Kaufmann, Christian A. []
	Unold, Thomas []
Publication date :	2017
Journal title :	Advanced Energy Materials
Publisher :	Wiley
Peer reviewed :	Yes (verified by ORBi^lu)
Audience :	International
ISSN :	1614-6832
e-ISSN :	1614-6840
City :	Weinheim
Country :	Germany
Permalink :	http://hdl.handle.net/10993/33036
DOI :	10.1002/aenm.201700167

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