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Survivable Passive Access Network (SPAN)
Wasim, Muhammad Umer; Zaidi, Syed Muhammad Hassan; Raja, Yasin et al.
2006In Conference on Next-Generation Communication and Sensor Networks (Optics East), October 02-04, Boston, Massachusetts USA.
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Keywords :
wavelength division multiplexed based passive optical networks (WDM-PON); survivability; bit error rate (BER)
Abstract :
[en] Wavelength Division Multiplexed based Passive Optical Networks (WDM-PON) are subjected to wide variety of incidental failures. It is preferred in WDM-PONs to provide fault management (survivability) at link layer level. In this paper, our objective is to determine the factors, which can increase the scope of survivability at link layer, not available currently. We propose a cost-effective recovery mechanism, called "Survivable Passive Access Network" (SPAN). SPAN is a multi-level protection scheme that has potential to be highly efficient and scaleable in terms of performance budget. BER performance and power penalty factors remain acceptable while switching traffic from normal path to protection path in case of failure.
Disciplines :
Computer science
Author, co-author :
Wasim, Muhammad Umer ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Zaidi, Syed Muhammad Hassan;  National University Of Sciences and Technology (NUST) > NUST School of electrical engineering and computer science (SEECS)
Raja, Yasin;  North Carolina's Urban Research University (UNC Charlotte) > Department of Physics and Optical Science
Ghani, Nasir;  University of South Florida > Electrical Engineering Department
Ahmad, Rizwan
External co-authors :
yes
Language :
English
Title :
Survivable Passive Access Network (SPAN)
Publication date :
2006
Event name :
Conference on Next-Generation Communication and Sensor Networks (Optics East)
Event place :
Boston, Massachusetts, United States
Event date :
October 02-04
Audience :
International
Main work title :
Conference on Next-Generation Communication and Sensor Networks (Optics East), October 02-04, Boston, Massachusetts USA.
Publisher :
SPIE
Peer reviewed :
Peer reviewed
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