Reference : Extended Survivable Passive Access Network (e-SPAN)
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/32623
Extended Survivable Passive Access Network (e-SPAN)
English
Wasim, Muhammad Umer mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Zaidi, Syed Muhammad Hassan mailto [National University Of Sciences and Technology (NUST) > NUST School of electrical engineering and computer science (SEECS)]
Raja, Yasin mailto [North Carolina's Urban Research University (UNC Charlotte) > Department of Physics and Optical Science]
Ghani, Nasir mailto [University of South Florida > Electrical Engineering Department]
Ahmad, Rizwan []
2006
Symposium on High Capacity Optical Networks and Enabling Technologies (HONET), September 6-8, Charlotte (NC) USA.
IEEE
Yes
978-1-4244-0519-0
Symposium on High Capacity Optical Networks and Enabling Technologies (HONET)
September 6-8
Charlotte, NC
USA
[en] wavelength division multiplexed based passive optical networks (WDM-PON) ; fault management ; survivability ; bit error rate (BER)
[en] Wavelength Division Multiplexed based Passive Optical Networks (WDM-PON) are subjected to wide variety of incidental failures. It is preferred in WDM-PONs to provide fault management (survivability) at link layer level. In this paper, our objective is to determine the factors, which can increase the scope of survivability at link layer, not available currently. We propose a cost-effective recovery mechanism, called ldquoExtended Survivable Passive Access Networkrdquo (e-SPAN). e SPAN is a multi-level protection scheme that has potential to corrects eventual errors that are caused by the transmission system by using different forward error correcting codes at receiver end, thus allowing us to have better performance budget in terms of BER and extended transmission distance of 8 to 12 Km.
Researchers ; Professionals
http://hdl.handle.net/10993/32623
10.1109/HONET.2006.5338405

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