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Extended Survivable Passive Access Network (e-SPAN)
Wasim, Muhammad Umer; Zaidi, Syed Muhammad Hassan; Raja, Yasin et al.
2006In Symposium on High Capacity Optical Networks and Enabling Technologies (HONET), September 6-8, Charlotte (NC) USA.
Peer reviewed
 

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Keywords :
wavelength division multiplexed based passive optical networks (WDM-PON); fault management; survivability; bit error rate (BER)
Abstract :
[en] Wavelength Division Multiplexed based Passive Optical Networks (WDM-PON) are subjected to wide variety of incidental failures. It is preferred in WDM-PONs to provide fault management (survivability) at link layer level. In this paper, our objective is to determine the factors, which can increase the scope of survivability at link layer, not available currently. We propose a cost-effective recovery mechanism, called ldquoExtended Survivable Passive Access Networkrdquo (e-SPAN). e SPAN is a multi-level protection scheme that has potential to corrects eventual errors that are caused by the transmission system by using different forward error correcting codes at receiver end, thus allowing us to have better performance budget in terms of BER and extended transmission distance of 8 to 12 Km.
Disciplines :
Computer science
Author, co-author :
Wasim, Muhammad Umer ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Zaidi, Syed Muhammad Hassan;  National University Of Sciences and Technology (NUST) > NUST School of electrical engineering and computer science (SEECS)
Raja, Yasin;  North Carolina's Urban Research University (UNC Charlotte) > Department of Physics and Optical Science
Ghani, Nasir;  University of South Florida > Electrical Engineering Department
Ahmad, Rizwan
External co-authors :
yes
Language :
English
Title :
Extended Survivable Passive Access Network (e-SPAN)
Publication date :
2006
Event name :
Symposium on High Capacity Optical Networks and Enabling Technologies (HONET)
Event place :
Charlotte, NC, United States
Event date :
September 6-8
Main work title :
Symposium on High Capacity Optical Networks and Enabling Technologies (HONET), September 6-8, Charlotte (NC) USA.
Publisher :
IEEE
ISBN/EAN :
978-1-4244-0519-0
Peer reviewed :
Peer reviewed
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