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CPAL: High-Level Abstractions for Safe Embedded Systems
NAVET, Nicolas; Fejoz, Loïc
2016In DSM 2016: Proceedings of the International Workshop on Domain-Specific Modeling
Peer reviewed
 

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Keywords :
Cyber-Physical Systems; Embedded Systems; Model-Driven Development; Control Applications; Dependability
Abstract :
[en] Innovation in the field of embedded systems, and more broadly in cyber-physical systems, increasingly relies on software. The productivity gain in software development can hardly keep up with the demand for software despite the increasing adoption of Model-Driven Development (MDD). In this context, we believe that major productivity and quality improvements are still ahead of us through better programming languages and environments. CPAL, the Cyber-Physical Action Language, is a contribution in that direction with the objective to speed-up the development of embedded systems with dependability constraints. The objective of this paper is to present and illustrate the use-cases of the high-level abstractions offered to the developer in CPAL with respect to real-time scheduling, introspection mechanisms, native support of Finite State Machines (FSMs), abstracting the hardware and decoupling functional concerns from non-functional concerns.
Disciplines :
Computer science
Author, co-author :
NAVET, Nicolas ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Fejoz, Loïc;  RealTime-at-Work (RTaW)
External co-authors :
yes
Language :
English
Title :
CPAL: High-Level Abstractions for Safe Embedded Systems
Publication date :
2016
Event name :
International Workshop on Domain-Specific Modeling (DSM 2016)
Event place :
Amsterdam, Netherlands
Event date :
30 Octobre 2016
Audience :
International
Main work title :
DSM 2016: Proceedings of the International Workshop on Domain-Specific Modeling
Publisher :
ACM, New-York, United States
ISBN/EAN :
978-1-4503-4894-2
Pages :
35-41
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
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